Uwe Bielke et.al.: Simulation and accuracy evaluation of a new 3D photogrammetric position measurement system. In: 22nd International Conference of the European Society for Precision Engineering and Nanotechnology, 2022. (EUSPEN, Geneva, 30 Mai - 3 Juni). URL: https://www.euspen.eu/product/book-22nd-international-conference-proceedings-geneva-2022/