TY - CHAP U1 - Konferenzveröffentlichung A1 - Pohl, Mario A1 - Kukso, Olga A1 - Rascher, Rolf A1 - Börret, Rainer ED - Williamson, Ray ED - Kim, Dae ED - Rascher, Rolf T1 - On the metrology of MSF errors after grinding T2 - Optical Manufacturing and Testing XII Y1 - 2018 SN - 9781510620551 SB - 9781510620551 U6 - https://doi.org/10.1117/12.2321007 DO - https://doi.org/10.1117/12.2321007 PB - SPIE CY - Bellingham, Washington, USA ER -