TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Börret, Rainer
A1  - Grün, Viktor
A1  - Seewig, Jörg
A1  - Ströer, Felix
A1  - Seyler, Tobias
A1  - Fratz, Markus
A1  - Beckmann, Tobias
A1  - Bertz, Alexander
A1  - Carl, Daniel
ED  - Kujawińska, Malgorzata
ED  - Jaroszewicz, Leszek
T1  - Extensive microstructural quality control inside a machine tool using multiwavelength digital holography
T2  - VII International Conference on Speckle Metrology
Y1  - 2018
SN  - 9781510622975
SB  - 9781510622975
U6  - https://doi.org/10.1117/12.2319750
DO  - https://doi.org/10.1117/12.2319750
PB  - SPIE
CY  - Bellingham, Washington, USA
ER  -