TY  - CHAP
U1  - Konferenzveröffentlichung
A1  - Vollert, Simon
A1  - Theissler, Andreas
T1  - Challenges of machine learning-based RUL prognosis: A review on NASA's C-MAPSS data set
T2  - 26th IEEE International Conference on Emerging Technologies and Factory Automation
Y1  - 2021
SN  - 978-1-7281-2989-1
SB  - 978-1-7281-2989-1
U6  - https://doi.org/10.1109/ETFA45728.2021.9613682
DO  - https://doi.org/10.1109/ETFA45728.2021.9613682
SP  - 1
EP  - 8
PB  - IEEE
ER  -