TY  - CPAPER
U1  - Konferenzveröffentlichung
A1  - Bielke, Uwe
A1  - Garcia, Luis
A1  - Harrison, David
A1  - Hageney, Theo
A1  - Banzhaf, Klaus
A1  - Wiedenmann, Ernst
A1  - Börret, Rainer
T1  - Simulation and accuracy evaluation of a new 3D photogrammetric position measurement system
T2  - 22nd International Conference of the European Society for Precision Engineering and Nanotechnology
Y1  - 2022
UR  - https://www.euspen.eu/product/book-22nd-international-conference-proceedings-geneva-2022/
ER  -