TY  - CHAP
A1  - Pohl, Mario
A1  - Kukso, Olga
A1  - Rascher, Rolf
A1  - Börret, Rainer
ED  - Williamson, Ray
ED  - Kim, Dae
ED  - Rascher, Rolf
T1  - On the metrology of MSF errors after grinding
T2  - Optical Manufacturing and Testing XII
Y1  - 2018
SN  - 9781510620551
U6  - http://dx.doi.org/10.1117/12.2321007
PB  - SPIE
CY  - Bellingham, Washington, USA
ER  - 
TY  - CHAP
A1  - Kukso, Olga
A1  - Rascher, Rolf
A1  - Börret, Rainer
A1  - Pohl, Mario
ED  - Rascher, Rolf
ED  - Fähnle, Oliver
T1  - On the metrology of the MSF errors
T2  - Fifth European Seminar on Precision Optics Manufacturing
Y1  - 2018
SN  - 9781510622708
U6  - http://dx.doi.org/10.1117/12.2318675
PB  - SPIE
CY  - Bellingham, Washington, USA
ER  -