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A Correlative Approach Combining Non-destructive High Resolution X-Ray Microscopy with Femtosecond Laser Preparation and FIB/SEM to Access Deeply Buried Features in Parts and Components of New Energy Vehicles

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Metadaten
Author:Tim SchubertORCiD, Benjamin Tordoff, Timo BernthalerORCiD, Gerhard SchneiderORCiD
DOI:https://doi.org/10.1093/micmic/ozad067.031
ISSN:1431-9276
Source Title (English):Microscopy and Microanalysis
Document Type:Article
Language:English
Year of Completion:2023
Release Date:2025/04/30
Volume:29
Issue:Supplement_1
Number of Pages:2
First Page:79
Last Page:80
Faculty:Weitere Einrichtungen
Open Access:Open Access
Licence (German):License LogoUrheberrechtlich geschützt