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On the metrology of MSF errors after grinding

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Metadaten
Author:Mario Pohl, Olga Kukso, Rolf Rascher, Rainer Börret
Institutional Author:Rainer Börret
DOI:https://doi.org/10.1117/12.2321007
ISBN:9781510620551
Source Title (English):Optical Manufacturing and Testing XII
Conference Date:19 - 23 August 2018
Conference Place:San Diego, United States
Publisher:SPIE
Place of publication:Bellingham, Washington, USA
Editor:Ray Williamson, Dae Kim, Rolf Rascher
Document Type:Conference Proceeding
Language:English
Year of Completion:2018
Release Date:2019/08/22
Series Title / Number:Proceedings of SPIE / 10742
Faculty:Maschinenbau und Werkstofftechnik