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Deutliche Effizienzsteigerung in der FIB/SEM-Analyse durch Femtosekunden Laser Präparation

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Metadaten
Author:Tim Schubert, Stefan Hiller, Tobias Volkenandt, Timo BernthalerORCiD, Gerhard Schneider
ISBN:978-3-88355-422-8
Source Title (German):Tagungsband zur 54. Metallographie-Tagung 2020
Conference Date:16-18 September
Conference Place:Online Veranstaltung
Document Type:Conference Proceeding
Language:German
Year of Completion:2020
Release Date:2022/05/03
First Page:118
Last Page:123
Faculty:Maschinenbau und Werkstofftechnik
Open Access:Closed Access