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Extensive microstructural quality control inside a machine tool using multiwavelength digital holography
Author: | Rainer Börret, Viktor Grün, Jörg Seewig, Felix Ströer, Tobias Seyler, Markus Fratz, Tobias Beckmann, Alexander Bertz, Daniel Carl |
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Institutional Author: | Rainer Börret |
DOI: | https://doi.org/10.1117/12.2319750 |
ISBN: | 9781510622975 |
Source Title (English): | VII International Conference on Speckle Metrology |
Conference Name: | SPECKLE 2018 |
Conference Date: | 9 - 12 September 2018 |
Conference Place: | Janów Podlaski, Poland |
Publisher: | SPIE |
Place of publication: | Bellingham, Washington, USA |
Editor: | Malgorzata Kujawińska, Leszek Jaroszewicz |
Document Type: | Conference Proceeding |
Language: | English |
Year of Completion: | 2018 |
Release Date: | 2019/08/22 |
Series Title / Number: | Proceedings of SPIE / 10834 |
Faculty: | Optik und Mechatronik |