• search hit 15 of 120
Back to Result List

Extensive microstructural quality control inside a machine tool using multiwavelength digital holography

Export metadata

frontdoor_export_ascii

Additional Services

Share in Twitter Search Google Scholar
Metadaten
Author:Rainer Börret, Viktor Grün, Jörg Seewig, Felix Ströer, Tobias Seyler, Markus Fratz, Tobias Beckmann, Alexander Bertz, Daniel Carl
Institutional Author:Rainer Börret
DOI:https://doi.org/10.1117/12.2319750
ISBN:9781510622975
Source Title (English):VII International Conference on Speckle Metrology
Conference Name:SPECKLE 2018
Conference Date:9 - 12 September 2018
Conference Place:Janów Podlaski, Poland
Publisher:SPIE
Place of publication:Bellingham, Washington, USA
Editor:Malgorzata Kujawińska, Leszek Jaroszewicz
Document Type:Conference Proceeding
Language:English
Year of Completion:2018
Release Date:2019/08/22
Series Title / Number:Proceedings of SPIE / 10834
Faculty:Optik und Mechatronik