Machine learning based detection and deep learning based image inpainting of preparation artefacts in micrographs
Author: | Andreas Jansche, Amit Choudhary, Timo T. Bernthaler, Gerhard Schneider |
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URL: | https://www.techconnectworld.com/World2021/a.php?i=308 |
Source Title (English): | Proceedings AI TechConnect 2021 |
Conference Date: | 18-20 Oktober |
Conference Place: | Washington, DC |
Document Type: | Conference Proceeding |
Language: | English |
Year of Completion: | 2021 |
Release Date: | 2022/09/23 |
First Page: | 118 |
Last Page: | 121 |
Faculty: | Maschinenbau und Werkstofftechnik |
Open Access: | Closed Access |