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Machine learning based detection and deep learning based image inpainting of preparation artefacts in micrographs

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Metadaten
Author:Andreas Jansche, Amit Choudhary, Timo T. Bernthaler, Gerhard Schneider
URL:https://www.techconnectworld.com/World2021/a.php?i=308
Source Title (English):Proceedings AI TechConnect 2021
Conference Date:18-20 Oktober
Conference Place:Washington, DC
Document Type:Conference Proceeding
Language:English
Year of Completion:2021
Release Date:2022/09/23
First Page:118
Last Page:121
Faculty:Maschinenbau und Werkstofftechnik
Open Access:Closed Access