Simulation and accuracy evaluation of a new 3D photogrammetric position measurement system
Author: | Uwe Bielke, Luis Garcia, David Harrison, Theo Hageney, Klaus Banzhaf, Ernst Wiedenmann, Rainer Börret |
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URL: | https://www.euspen.eu/product/book-22nd-international-conference-proceedings-geneva-2022/ |
Source Title (English): | 22nd International Conference of the European Society for Precision Engineering and Nanotechnology |
Conference Name: | EUSPEN |
Conference Date: | 30 Mai - 3 Juni |
Conference Place: | Geneva |
Document Type: | Conference Proceeding |
Language: | English |
Year of Completion: | 2022 |
Release Date: | 2025/01/14 |
Faculty: | Optik und Mechatronik |
Open Access: | Closed Access |