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Simulation and accuracy evaluation of a new 3D photogrammetric position measurement system

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Metadaten
Author:Uwe Bielke, Luis Garcia, David Harrison, Theo Hageney, Klaus Banzhaf, Ernst Wiedenmann, Rainer Börret
URL:https://www.euspen.eu/product/book-22nd-international-conference-proceedings-geneva-2022/
Source Title (English):22nd International Conference of the European Society for Precision Engineering and Nanotechnology
Conference Name:EUSPEN
Conference Date:30 Mai - 3 Juni
Conference Place:Geneva
Document Type:Conference Proceeding
Language:English
Year of Completion:2022
Release Date:2025/01/14
Faculty:Optik und Mechatronik
Open Access:Closed Access